Published: 27th March 2014
DOI: 10.4204/EPTCS.141
ISSN: 2075-2180

EPTCS 141

Proceedings Ninth Workshop on
Model-Based Testing
Grenoble, France, 6 April 2014

Edited by: Holger Schlingloff and Alexander K. Petrenko

Preface
Alexander K. Petrenko and Holger Schlingloff
Using Formal Specifications to Support Model Based Testing ASDSpec: A Tool Combining the Best of Two Techniques
A.P. van der Meer, R. Kherrazi and M. Hamilton
1
Verifying Web Applications: From Business Level Specifications to Automated Model-Based Testing
Christian Colombo, Mark Micallef and Mark Scerri
14
Coverage Criteria for Model-Based Testing using Property Patterns
Kalou Cabrera Castillos, Frédéric Dadeau and Jacques Julliand
29
Spinal Test Suites for Software Product Lines
Harsh Beohar and Mohammad Reza Mousavi
44
Generating Complete and Finite Test Suite for ioco: Is It Possible?
Adenilso Simao and Alexandre Petrenko
56

Preface

This volume contains the proceedings of the Ninth Workshop on Model-Based Testing (MBT 2014), which was held in Grenoble, France on April 6, 2014 as a satellite workshop of the European Joint Conferences on Theory and Practice of Software (ETAPS 2014).

The first workshop on Model-Based Testing (MBT) in this series took place in 2004, in Barcelona. At that time model-based testing already had become a hot topic, but MBT 2004 was the first event devoted exclusively to this domain. Since that time the area has generated enormous scientific and industrial interest, and today there are several other workshops and conferences on software and systems design, modelling and quality assurance, covering also model based testing. In a way, MBT has become “mainstream”, and in various domains the technology has matured to an industrially established practice. Still, the MBT series of workshops offers a unique opportunity to share new technological and foundational ideas particular in this area, and to bring together researchers and users of model-based testing to discuss the state of the theory, applications, tools, and industrialization.

Model-based testing has become one of the most powerful system analysis methods, where the range of possible applications is still growing. Similar as in previous years, we see the following main directions of development.

This year’s MBT workshop features Alexandre Petrenko from the Computer Research Institute of Montreal, Canada, as an invited speaker. His talk and paper reflects on the use of nondeterminism in test models and the derivation of test cases from nondeterministic models. Furthermore, the accepted contributions, selected carefully by the program committee, show the above research trends. Christian Colombo, Mark Micallef and Mark Scerri report on testing of web services using a combination of tools and technics (Selenium, Cucumber and QuickCheck); in particular, they provide a natural language interface to a test generation tool. Harsh Beohar and Mohammadreza Mousavi address the conformance testing problem for software product lines; they introduce the idea of a “spine” which prunes the testing of a product derived from an already tested product. Adenilso Simao and Alexandre Petrenko generate finite complete test suites for predefined fault domains in I/O transition systems with the ioco conformance relation. Arjan van der Meer, Rachid Kherrazi and Marc Hamilton describe the combination of a model driven design tool (ASD) with an MBT tool (Spec Explorer), thereby combining formal analysis methods and model-based testing techniques. Kalou Cabrera Castillos, Frederic Dadeau and Jacques Julliand propose temporal property patterns over UML models for test case generation and show how to apply coverage criteria and mutations for robustness testing.

We would like to thank the program committee members and all reviewers for their work in evaluating the submissions. We also thank the ETAPS 2014 organizers for their assistance in the preparation of the workshop and the editors of EPTCS for help in publishing these proceedings.

Alexander K. Petrenko and Holger Schlingloff, March 2014.

Program committee

Additional reviewers